Jonas Schoenen, Jonas Gehrunger, Leon Mayrhofer, Timo Oster, Eszter Piros, Taewook Kim, Alexey Arzumanov, Enrique Miranda, Klaus Hofmann, Lambert Alff, Christian Hochberger (2026):
Impact of fabrication defects on FPGA logic using memristor-based memory cells.
In: Micromachines, ISSN 2072-666X, MDPI,
DOI: https://doi.org/10.3390/mi17040429,
[Article]